3: Reflectance and transmittance spectra in 190–1000nm range of ITO deposited on the glass substrate described above, plus the, Ex. part may be reproduced without the written permission. ] E The behavior of the k(λ) spectrum of ITO in the near-infrared (NIR) and infrared (IR) wavelength ranges resembles that of a metal: non-zero in the NIR range of 750–1000 nm (difficult to discern in the graphics since its values are very small) and reaching a maximum value in the IR range (λ>1000 nm). Finally, the experimental complex optical constants are determined in the wavelength range of 300–1200 nm, which fully covers the spectrum response range of a CsPbI3/c‐Si tandem cell. 35 are in a low reliability. When used with a spectroscopic reflectometry tool, the Forouhi–Bloomer dispersion equations specify n and k for amorphous and crystalline materials as a function of photon energy E. Values of n and k as a function of photon energy, E, are referred to as the spectra of n and k, which can also be expressed as functions of wavelength of light, λ, since E = hc/λ. [ − 2 Use the link below to share a full-text version of this article with your friends and colleagues. 35 are not plotted because they are between that at the two angles of 55°and 70°. g During the aforementioned simulations, a square convolution profile shape was adopted, which is based on the cross‐sectional SEM images measured. Often a blanket area on the trench sample with the film of interest is present for the measurement. The present results have opened the door to conduct design and simulations on the photovoltaics devices based on air‐stable CsPbI3 thin films including high‐efficiency CsPbI3/c‐Si tandem solar cells. B However, knowledge of complex optical constants of the CsPbI3 thin films is mandatory to complement such tasks. ( [2] The 1986 publication relates to amorphous materials, while the 1988 publication relates to crystalline. In addition, no any details including the adopted model, fitting parameters, comparison between the ellipsometric data and the fitting results, as well as sample stability were given.35 Because the PCE of CsPbI3 perovskite solar cells is progressing fast with latest report of up to 18%,10, 18-20, 36 the experimental determination of the optical constants of CsPbI3 perovskite thin films is never as urgent as now. i The figure shows a measurement example of a photoresist (polymer) material used for 248 nm micro-lithography. E Thank you for taking your time to send in your valued opinion to Science X editors. Ref. i 2 Opposite the substrate, a metal sample is positioned. Why find the highest order maxima/minima in slit equations? 2 . = Variable angle spectroscopic ellipsometry (VASE) is measured at five angles (43.9°, 48.9°, 53.9°, 58.9°, and 63.9°) to obtain the complex optical constants of the present CsPbI3 thin films. The content is provided for information purposes only. YA516/1‐1). When the measurement involves two or more films in a stack of films, the theoretical expression for reflectance must be expanded to include the n(λ) and k(λ) spectra, plus thickness, t, of each film. The variation of the obtained complex optical constants was assessed based on different samples and instruments. The authors thank Dr. Ulrich W. Paetzold, Dr. Kunyuan Xu, and Dr. Dmitry Busko for useful discussions and technical support.

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